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气体流量比对氮化铜薄膜结构与电催化析氢性能的影响

Effect of Gas Flow Rate Ratio on The Structure and Electrocatalytic Hydrogen Evolution Performance of Cu3N Thin Films

  • 摘要: 在不同气体流量比下,采用磁控溅射技术制备了氮化铜(Cu3N)薄膜,研究探索了结构与电催化析氢性能的关联机制。结果表明,随着气体流量比(R)从0.05增至0.25,薄膜中氮含量从16.08%显著提升至30.15%,铜含量相应降低;当R为0.20时, Cu3N薄膜的光学带隙最小(1.32 eV),且电催化析氢性能最优,其过电位和塔菲尔斜率分别317.76 mV和259.28 mV·dec−1。结果表明,富铜改变了Cu3N的电子结构和活性位点分布,提升了析氢反应活性。本研究为气体流量比调控Cu3N薄膜的制备及其在氢能领域的应用提供技术参考。

     

    Abstract: Copper nitride (Cu3N) films were fabricated by magnetron sputtering under different gas flow ratios, and the correlation mechanism between the structure and the electrocatalytic hydrogen evolution performance was investigated. The results showed that as the gas flow ratio (R) increased from 0.05 to 0.25, the nitrogen content in the film significantly increased from 16.08% to 30.15%, while the copper content decreased accordingly. When R is 0.20, the optical bandgap of Cu3N thin film is the smallest (1.32 eV), and its electrocatalytic hydrogen evolution performance is optimal, with overpotential and Tafel slope of 317.76 mV and 259.28 mV·dec−1, respectively. The results showed that copper enrichment changed the electronic structure and active site distribution of Cu3N thin films, enhancing the activity of the hydrogen evolution reaction. This study provides technical reference for the preparation of Cu3N thin films and their application in the field of hydrogen energy controlled by gas flow ratio.

     

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