高级检索

低频容性耦合Ar/O2放电特性研究

Discharge Characteristics of Low Frequency Capacitively Coupled Ar/O2

  • 摘要: 本文使用了一维流体模型对驱动频率为40 kHz的Ar/O2放电特性进行研究,着重讨论电压、气压、极板间距等外界条件对电离率、等离子体密度、电子温度和极板处离子能量等参数的影响。结果显示低频放电中γ模式占主导,DA(drift-ambipolar)模式非常微弱近乎忽略不计,且外界参数的变化并没有影响放电模式;低频放电的另一个特征为离子能量较高。此外,电压的增加使得等离子体密度和O2+能量迅速增大,鞘层区的电子温度随着电压的增大而上升,但等离子体区电子温度是下降的。气压和极板间距的增大也会使等离子体密度和离子能量增大,而鞘层区和等离子体区的电子温度均减小。

     

    Abstract: In this paper, the one-dimensional fluid model is used to study the characteristics of Ar /O2 discharge with a driving frequency of 40 kHz. The effects of external conditions such as voltage, pressure and plate spacing on the ionization rate, plasma density, electron temperature, and ion energy at the plate are discussed. The results show that the γ mode is dominant in the low-frequency discharge, the DA (drift-ambipolar) mode is very weak and almost negligible, and there is no mode conversion phenomenon when the external parameters change. Another characteristic of low-frequency discharge is high ion energy. In addition, the increase in voltage makes the plasma density and O2+ energy increase rapidly, and the electron temperature in the sheath region increases with the increase of voltage, but the electron temperature in the plasma region decreases with the increase of voltage. The increase in pressure and plate spacing will also increase the plasma density and ion energy, while the electron temperature in the sheath region and the plasma region decreases with the increase of pressure and plate spacing.

     

/

返回文章
返回