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透射菊池衍射技术(TKD)的进展研究

Research on the Progress of Transmission Kikuchi Diffraction Technology(TKD)

  • 摘要: 电子背散射衍射(EBSD)技术在材料晶体结构及取向信息的研究方面作出很大贡献,但其空间分辨率较低,在纳米晶体表征方面遇到困难。透射菊池衍射(TKD)技术自2012年提出以来,因其较高的空间分辨率,迅速在纳米材料表征领域受到极大关注。本文通过查阅总结大量文献,回顾了TKD技术的发展历程,并对其研究进展进行了总结。其中主要包括三大部分,首先介绍了TKD的工作原理及部分重要设置参数的影响。其次介绍了TKD近几年在纳米晶粒、大变形量金属以及氧化物薄膜等领域的应用。最后对TKD表征技术在未来的发展趋势进行了展望。

     

    Abstract: Electron backscatter diffraction (EBSD) technology has made great contributions to the researchof material crystal structure and orientation information,but its spatial resolution is low(which is greater than 100 nanometers),so it is difficult for researchers to characterize nanocrystals. Since the transmission Kikuchi diffrac-tion (TKD) technology was proposed in 2012,it has quickly received great attention in the field of nanomaterialcharacterization due to its high spatial resolution. This article reviewed the development of TKD technology by re-viewing a large number of literatures. The development history of TKD technology was reviewed,and the researchprogress of TKD was also summarized. It mainly includes three parts. Firstly,the working principle of TKD and theinfluence of some important setting parameters are introduced. Secondly,the application of TKD in the fields ofnanocrystalline grains,large deformation metals and oxide films in recent years is introduced. Finally,the futuredevelopment trend of TKD characterization technology is prospected.

     

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