两层正交低气压等离子体阵列对目标反射特性的影响研究
Study on the Influence of Two-Layer Orthogonal Low-Pressure Plasma Array on Target’s Reflection Characteristics
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摘要: 提出一种两层正交低气压等离子体阵列,采用数值模拟和实验方法,分析该阵列中等离子体电子密度和结构参数对X波段和垂直偏振下目标反射特性的影响。结果表明,电磁波与正交等离子体阵列发生谐振,使得谐振处的衰减很大;改变等离子体阵列的层间距,可以激发不同的谐振模式,使同一层间距下的反射曲线上出现多个谐振频率。仿真和实验结果还可知,随着等离子体电子密度的增加,衰减峰向高频率移动;而增加等离子体阵列的层间距,衰减峰向低频率移动。研究结果可为等离子体周期性结构的设计与应用提供参考。Abstract: A two-layer orthogonal low-pressure plasma array is proposed. The numerical simulation and experimental methods are used to analyze the influence of the plasma electron density and structural parameters for the array on the reflection characteristics of the target in the X-band range and vertical polarization. The results show that electromagnetic wave resonates with the orthogonal plasma array, resulting in a great attenuation at the resonance point. To change the layer spacing of the plasma array may excite different resonance modes, so that multiple resonance frequencies appear at the reflection curve under the same layer spacing. The simulation and experimental results show that the attenuation peak moves to the higher frequency with the plasma electron density rising,while the increase of the layer spacing of the plasma array makes the attenuation peak move to the lower frequency.These results can provide a reference for the design and application of the plasma periodic structure.