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李宁, 杨庆喜, 宋云涛, 周才品, 徐皓, 陈建, 陶腊宝, 陆坤. CFETR外真空杜瓦结构分析与疲劳寿命评估[J]. 真空科学与技术学报. DOI: 10.13922/j.cnki.cjvst.202101002
引用本文: 李宁, 杨庆喜, 宋云涛, 周才品, 徐皓, 陈建, 陶腊宝, 陆坤. CFETR外真空杜瓦结构分析与疲劳寿命评估[J]. 真空科学与技术学报. DOI: 10.13922/j.cnki.cjvst.202101002
LI Ning, YANG Qingxi, SONG Yuntao, ZHOU Caipin, XU Hao, CHEN Jian, TAO Labao, LU Kun. Structural Analysis and Fatigue Life Evaluation of External Vacuum Cryostat of CFETR[J]. CHINESE JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. DOI: 10.13922/j.cnki.cjvst.202101002
Citation: LI Ning, YANG Qingxi, SONG Yuntao, ZHOU Caipin, XU Hao, CHEN Jian, TAO Labao, LU Kun. Structural Analysis and Fatigue Life Evaluation of External Vacuum Cryostat of CFETR[J]. CHINESE JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. DOI: 10.13922/j.cnki.cjvst.202101002

CFETR外真空杜瓦结构分析与疲劳寿命评估

Structural Analysis and Fatigue Life Evaluation of External Vacuum Cryostat of CFETR

  • 摘要: 外真空杜瓦是中国磁约束核聚变工程实验堆(CFETR)装置主机的外侧大型(直径D=38 m,高度H=39.6 m)真空容器,旨在为CFETR装置主机内部超导磁体提供稳定运行的高真空环境。外真空杜瓦需要经受100次抽放真空和500次真空室烘烤等运行工况。然而,在这些工况下,外真空杜瓦的薄弱部位可能因为热周期性交变载荷(1个大气压和200℃烘烤)而产生疲劳裂纹,导致容器发生裂缝泄漏或损坏而失效。因此,文章利用有限元方法重点分析了在抽放真空循环和真空室烘烤循环运行工况下,外真空杜瓦结构的最大受力位置和危险部位的疲劳仿真。通过分析结果,获得了外真空杜瓦在1个大气压和200℃烘烤带来的热周期性交变载荷下的整体受力分布情况,并评估了外真空杜瓦在疲劳失效后的使用寿命。这些分析结果为核查外真空杜瓦是否满足使用要求以及进行优化提供了理论依据。采用的分析方法也可以起到有益的参考作用,用于分析评价其它同类设备。

     

    Abstract: The outer vacuum cryostat is a large-scale (D = 38 m, H = 39.6 m) vacuum container located on the outer side of the China Fusion Engineering Test Reactor (CFETR) device. It is designed to provide a stable high vacuum environment for the internal superconducting magnets of the CFETR device. The cryostat is subjected to operational conditions that include 100 cycles of vacuum pumping and 500 cycles of vacuum chamber baking. However, under these operational conditions, the weak regions of the cryostat are susceptible to fatigue cracking due to thermal cyclic loading caused by 1 atmosphere pressure and 200℃ baking. Such fatigue cracks can lead to the development of cracks, leakage, and eventual failure of the entire vessel. Therefore, this study focuses on the fatigue simulation analysis of the cryostat structure at the locations of maximum stress and critical positions during vacuum pumping and vacuum chamber baking cycles using the finite element method. The analysis results provide insights into the overall stress distribution of the cryostat under thermal cyclic loading of 1 atmosphere pressure and 200°C baking and allow for an evaluation of its fatigue life after failure. These findings serve as a theoretical basis for verifying whether the cryostat meets the usage requirements and provides a foundation for optimization. The analytical approach employed in this study can also be applied to similar devices for analysis and evaluation purposes.

     

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