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ZHANG Ruifang, CHENG Yongjun, SUN Wenjun, ZHAO Lan, DONG Meng, FENG Tianyou, CHEN Lian. Research and Development of Static Expansion Vacuum Standards and Key TechnologiesJ. CHINESE JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. DOI: 10.13922/j.cnki.cjvst.202510020
Citation: ZHANG Ruifang, CHENG Yongjun, SUN Wenjun, ZHAO Lan, DONG Meng, FENG Tianyou, CHEN Lian. Research and Development of Static Expansion Vacuum Standards and Key TechnologiesJ. CHINESE JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. DOI: 10.13922/j.cnki.cjvst.202510020

Research and Development of Static Expansion Vacuum Standards and Key Technologies

  • The static expansion vacuum standard, serving as the ultimate traceability reference for vacuum measurement values across nations, is widely adopted due to its simple principle and low uncertainty. As bottlenecks emerge in the deepening development of science and technology across various fields, demands for vacuum calibration traceability capabilities continue to rise. Consequently, countries persistently conduct experimental research on static expansion vacuum systems and their key technologies, enhancing vacuum measurement capabilities through continuous updates and iterations. This article reviews research progress on static expansion vacuum systems and their key technologies in over ten countries, including Germany, England, China, and Japan, while also outlining future development directions for static expansion vacuum systems.
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