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Wu Qinbin, Luo Richeng, Wang Xueyu, Huang Jun, Xiao Hongfeng, Tian Dikai, Zhang Yufei. Impedance of RF Capacitive Coupled Plasma: A Simulation and Analytical Study[J]. CHINESE JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY, 2020, 40(5): 458-464. DOI: 10.13922/j.cnki.cjovst.2020.05.12
Citation: Wu Qinbin, Luo Richeng, Wang Xueyu, Huang Jun, Xiao Hongfeng, Tian Dikai, Zhang Yufei. Impedance of RF Capacitive Coupled Plasma: A Simulation and Analytical Study[J]. CHINESE JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY, 2020, 40(5): 458-464. DOI: 10.13922/j.cnki.cjovst.2020.05.12

Impedance of RF Capacitive Coupled Plasma: A Simulation and Analytical Study

  • The formation of RF capacitive coupled plasma(CCP) of helium was empirically approximated by ignoring the convection of heavy particles,mathematically formulated with 1 D plate-plate electrode model,theoretically analyzed and numerically simulated in finite element method.The influence of the four key variables,including the pressure,input power,electrode-diameter and gap-length,on the CCP-impedance was investigated in simulation and by data analysis.The simulated results show that the key variables all have a major impact.To be specific,as the pressure and gap-length increase,the CCP-impedance changes in a decrease-increase(V-shape) mode,simply because the probability of collision ionization varies in an increase-decrease manner;as the electrode diameter and input power increase,the CCP-impedance decreases,slowly approaching a stable value.We suggest that the simulated results be of some basic and technological interest in industrial plasma engineering.
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